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Materials Characterisation Facilities

 

 

High Resolution Transmission and Scanning Electron Microscopes*
Atomic Force Microscope*

Reichert Ultracut E Ultramicrotomes*

Bio-Red MRC 600 Confocal Laser Scanning Microscope*

Raman Spectrometers*

Infrared Spectrometers*

NMR Spectrometers*

TA Instrument DMA and Modulated DSC

Ultrasonic Immersion Test System (C-SCANNER)

Hot Stage (up to 325°C), METTLER CELL FP 82 HT and METTLER FP 90 PROCESSOR

Electronic Microbalance (0.01 mg accuracy)

Leitz, laborlux 12 Pol S, Optical Microscope (with image analyser)

Leica DM-RXE Optical Microscope (with transmitted light, incident light (BF/DF) and differential interference contrast)

BUEHLER, PETRO-THIN, Thin Section System.

STRUERS, Dap-7/Pedemin-S, Automatic Polishing System

Leitz 1512 Microtome

X-ray Diffractometers*

General Purpose Optical Microscopes

Colour Image Analysis System (with varying image sources through a video camera)

* Facilities outside but freely accessible to the CAMT.
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DMA

Specifications

  Test Modes 3 Point Bending, Cantilever, Shear, Compression, Tension, Penetration
Experiment Modes Multi-frequency, Multi-strain, Creep, Stress Relaxation, Cotrolled Force/Strain
Force 0.001 N to 18 N
Frequency 0.01 Hz to 200 Hz
Temperature -15oC to 600oC
Data Interval 2 - 15 seconds/point variable
Amplitude 0.5 to 10000 mm

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DSC

Specifications
DSC Temperature Range -150oC to 725oC ± 0.1 oC
Sample Limitations 0.5 to 100 mg & 10 mm3
Measurment Sensitivity 0.2 mW
Baseline Noise 0.1 mW

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Optical Microscope

Specifications
Microscope    
   

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